JEOL USA | Cross Section Polisher
The IB19530CP Ion Beam Cross Section Polisher (CP) produces pristine cross sections of samples – hard, soft, or composites – without smearing, crumbling, distorting, or contaminating them in any way. There is no precedent for a cross sectioning instrument of this type for SEM, EPMA, and SAM sample preparation. The ability to create perfect cross sections of paper, shale, yeast, latex ...